Velleman EVM831 Manual do Utilizador descarregar pdf (Página 9)

28.04.2010

Notes:

• For DC-c

u

red test l

• The µA a

F500mA

/

fuse.

Resistance

m

Do n

o

• Connect th

e

jack.

• Set the sel

e

unknown, a

appropriate

• Connect th

e

• The measu

r

Notes:

• Never pe

capacito

r

• To incre

a

tips of th

the test l

• For resis

t

to stabili

z

• Should t

h

open cir

c

Continuity te

s

Do n

o

• Connect th

e

VmA

j

ack

• Set the sel

e

• Connect th

e

• When the

m

produced a

n

resistance

e

will show “1

Note:

• Never pe

capacito

r

Diode test

Do n

o

• Connect th

e

VmA

j

ack

• Set the sel

e

• Connect th

e

the anode,

b

u

rrent measurement

s

ead, the indicated va

l

nd mA-ranges are pr

o

/

250V fuse; the 10A r

a

m

easurements

o

t perform resistan

c

e

red test lead to the

V

e

ction switch to the d

e

lways select the hi

g

h

e

ran

g

e.

e

test probes to the ci

r

r

ed value appears on

t

rform resistance mea

r

s are completely disc

h

a

se accuracy when m

e

e measurin

g

probes t

eads. Subtract this v

a

t

ance measurements

a

z

e the read-out.

h

e measured resistan

c

c

uit, the display will s

h

s

t

o

t perform continui

t

e

black test lead to th

e

.

e

ction switch to 200

e

test leads to the circ

m

easured resistance i

s

n

d the resistance is s

h

e

xceed the selected r

a

”.

rform continuity mea

s

r

s are completely disc

h

o

t perform diode m

e

e

black test lead to th

e

.

e

ction switch to 2000

e

test leads to the circ

b

lack test probe to th

e

EVM831

9

s

, when a ne

g

ative po

l

l

ue is preceded by a “

o

tected a

g

ainst ove

r

-

c

a

n

g

e is protected wit

h

c

e measurements o

n

V

mA

j

ack and the b

e

sired "Ω” range. Whe

e

st possible ran

g

e an

d

r

cuit/component und

e

t

he display.

surements on a live

c

h

ar

g

ed.

e

asurin

g

low resistan

c

o

g

ether to determine

a

lue from the measur

e

a

bove 1M the mete

r

c

e exceed the selecte

d

h

ow “1”.

t

y measurements o

n

e

COM

j

ack and the r

e

.

uit/component under

s

less than 50 a con

t

h

owed on the display.

a

n

g

e or in case of an

o

s

urements on a live c

h

ar

g

ed.

e

asurements on liv

e

e

COM

j

ack and the r

e

.

uit/component under

e

cathode).

©Velleman n

v

l

arity is present at th

e

-” sign.

c

urrent with a cerami

c

h

a ceramic F10A/250

n

live circuits.

lack lead to the "CO

M

n the ran

g

e is

d

lower to the

e

r test.

c

ircuit and make sure

c

e values, first hold th

the resistance value

e

d value of the circui

t

r

needs a few second

s

d

ran

g

e or in case of

a

n

live circuits.

e

d test lead to the

test.

t

inuous beep is

Should the measure

d

o

pen circuit, the displ

a

ircuit and make sure

a

e

circuits.

e

d test lead to the

test (red test probe

t

v

e

c

V

M

"

all

e

of

t

.

s

a

n

d

a

y

a

ll

t

o

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